Showing results: 76 - 90 of 469 items found.
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NX5300 -
Terotest Systems Ltd.
The NX5300 is a single slot 3U PXI device and interfaces to the unit under test via an On-Chip Debug (OCD) or JTAG port. The NX5300 is a high performance JTAG based background debug mode (BDM) diagnostic system designed for functional test, development, programming and troubleshooting of microprocessor and microcontroller based embedded processor systems.
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Sparrow MTS30 -
Digitaltest GmbH
The SPARROW MTS 30 is a portable rack System that, with a size of 19'''' fits into any universal rack. The compact and flexible test System offers the possibility to run both analog and digital tests. Additionally, the SPARROW can also accommodate 4 programmable power supplies. With the available In-Circuit and Functional Test Modules most of the required testing tasks can be resolved in a simple and cost-effective manner.
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Pickering Interfaces Ltd.
Pickering's GPIB (IEEE-488) switching systems offer you a comprehensive line of switching modules that are ideal for functional test, factory automation and data acquisition applications. These GPIB switching systems range from small low-cost entry level systems to large high performance units with extensive built in self-test.
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Bloomy Controls, Inc.
Reliable connections to device under test (DUT) test points are essential for robust functional test. Bloomy provides rugged fixtures and cable sets (ITAs) built for thousands and thousands of cycles in manufacturing environments. With the industry’s best mass interconnects and internal electronic keying, our fixtures are easy to change out and are automatically recognized by the test system.
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Bloomy Controls, Inc.
The Battery Management System (BMS) Manufacturing Test System performs functional testing of product during end-of-line manufacturing. The system hardware includes all instrumentation to test a BMS, including multiple cell simulators, a mass interconnect for quick product transition and bed-of-nail fixtures to ensure less down time, higher throughput, and easy maintenance. The system application easily integrates into manufacturing processes, provides a method to test multiple product types, and optimizes tests to ensure only good product is released from manufacturing.
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Weshine Electric Manufacturing Co., Ltd
Given the diverse functional requirements of the grid’s protection system, testing capabilities require a new level of sophisticated test hardware and software with which to analyse the entire protection system’s (or individual protection component’s) operation in "real life" situations.
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Teradyne, Inc.
High-performance VXI and PXI instruments for digital functional test. Teradyne’s Di-Series and eDigital-Series digital test instruments address technologies such as low voltage differential signaling (LVDS), while maintaining full capability to support legacy test requirements. In addition to excellent reliability, these instruments reduce test system footprint, programming and support effort, and overall cost-of-ownership.
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ATEasy -
Marvin Test Solutions, Inc.
ATEasy is a test executive and a rapid application development framework for functional test, ATE, data acquisition, process control, and instrumentation systems. ATEasy provides all the necessary tools to develop, deploy and maintain software components - including instrument drivers, test programs, and user interfaces, as well as a complete and customizable test executive. It is designed to support and simplify ATE system applications with long product life cycles. With ATEasy, test applications are faster to generate and easier to maintain.
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Data Patterns Pvt. Ltd.
Redundant Strap down Inertial Navigation System (RESINS) checkout test station comprises of cPCI chassis with various functional I/O modules like ADC, DAC, DIO, VFC, Relay matrix, MIL 1553, GPIB, Serial communication interfaces and Custom Built System interface adaptor.
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Z-Axis Europe
FTFs are test fixtures which are dedicated for testing flex-based components and assemblies such as displays, touch panels and more. A weak spot in a typical functional test system is the method to connect DUT flexible cable to a circuit board where the simple method of attaching the flex directly with an ZIF or LIF connector fails.
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Artiza Networks Inc.
The DuoSIM and DuoSIM-Advanced are the most scalable eNodeB test systems in the industry. From basic functional testing to complex C-RAN environment simulation, the DuoSIM line of testers makes validation and development of network equipment faster, easier, and more cost effective.
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TestLeft -
SmartBear Software
TestLeft is a powerful yet lean functional testing tool for dev-testers working in Agile teams. It fully embeds into standard development IDEs. A built-in access to object and method library is also available with TestLeft. Dev-testers can thereby easily and quickly create robust functional automated tests without leaving their favorite IDEs such as Visual Studio. It also works well with other tools in dev eco-systems such as source control or continuous integration systems.
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6TL Engineering
Two pushers plate available for max. DUT areas: 450×450 and 500×650 mm 6tl precision servo pusher H7100 6000 is the recommended solution for PCB test systems combining Functional, In-Circuit, and Hipot Test in one fixture.It is available as a 19″ Rack atonomous module, including all drive, control and safety components for easy integration in automatic test systems using standard Mass Interconnection Receivers.
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EIIT, S.A.
Control develops and supplies fixtures and test accessories :*For a vast field of applications - ICT (In-Circuit Test), functional test, Flash programming, EoL (End-of-Line) test systems, etc.*For all handling systems currently used in the market: online or offline, mechanical, pneumatic or vacuum operation*From simple mechanical fixtures, with a few hundred probes and low production volumes, to highly complex accessories with thousands of probes, double-sided probes, double acting, etc.
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Yokogawa Test & Measurement Corp.
For general purpose standalone applications or as core components in a high speed test and measurement system, Yokogawa sources and signal generators are highly accurate and functional. The integration of source and measurement into a single unit greatly simplifies the test process. Semiconductor devices, sensors, displays or batteries etc can therefore be quickly and easily characterized.